Paper
10 April 1996 Derivation of 2.5D image models from one-dimensional x-ray image sensors
Author Affiliations +
Proceedings Volume 2653, Stereoscopic Displays and Virtual Reality Systems III; (1996) https://doi.org/10.1117/12.237435
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States
Abstract
This paper describes on-going research into the development of a 21/2D image modeling technique based on the extraction of relative depth information from stereoscopic x-ray images. This research was initiated in order to aid operators of security x-ray screening equipment in the interpretation of complex radiographic images. It can be shown that a stereoscopic x-ray image can be thought of as a series of depth planes or slice images which are similar in some respects to tomograms produced by computed tomography systems. Thus, if the slice images can be isolated the resulting 3D data set can be used for image reconstruction. Conceptually, the production of a 21/2D image from a stereoscopic image can be thought of as the process of replacing the physiological depth cue of binocular parallax, inherent in a stereoscopic image, with the psychological depth cues such as occlusion and rotation. Once the data is represented in this form it is envisaged that, for instance in the case of a security imaging scenario a suspicious object could be electronically unpacked. The work presented in this paper is based on images obtained from a stereoscopic folded array dual energy x-ray screening system, designed and developed by the Nottingham Trent University group.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Paul Owain Evans, Simon X. Godber, and Max Robinson "Derivation of 2.5D image models from one-dimensional x-ray image sensors", Proc. SPIE 2653, Stereoscopic Displays and Virtual Reality Systems III, (10 April 1996); https://doi.org/10.1117/12.237435
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KEYWORDS
X-rays

X-ray imaging

Image sensors

Image processing

Sensors

Dual energy imaging

Inspection

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