Scientific CMOS CID imagers

Jeffrey J. Zarnowski; Joseph Carbone; Matthew A. Pace

doi:10.1117/12.236116

25 March 1996 Scientific CMOS CID imagers

Jeffrey J. Zarnowski, Joseph Carbone, Matthew A. Pace

Author Affiliations +

Proceedings Volume 2654, Solid State Sensor Arrays and CCD Cameras; (1996) https://doi.org/10.1117/12.236116
Event: Electronic Imaging: Science and Technology, 1996, San Jose, CA, United States

Abstract

A new family of binary format CMOS CID imagers was designed to meet the random pixel addressing and on-chip signal manipulation requirements of may scientific applications. Key features include true random pixel and programmable subarray addressing, non-destructive readout and charge injection (clearing) that eliminate the need to read out superfluous pixels. And, programmable horizontal/vertical binning provides improved signal/noise and permits spatial signal consolidation even when reading out overlapping subarrays. The imagers incorporate on-chip preamplifiers for low noise readout. Inherent CID pixel characteristics such as non-destructive, non-blooming read-out that permit adaptive exposure control and linear dynamic range extension are maintained. Formats include 1024², 512², and 1024 X 256. All incorporate 27.0 micron contiguous square pixels with in excess of 10⁶ electron well capacity. Serial horizontal and vertical input ports are provided to accept the coordinates of the pixel or subarray to be readout. Rapid subarray readout is facilitated via a single pixel advance clock that is used in conjunction with each random access decoder. A description of the architecture, imager operation and application will be presented.

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Jeffrey J. Zarnowski, Joseph Carbone, and Matthew A. Pace "Scientific CMOS CID imagers", Proc. SPIE 2654, Solid State Sensor Arrays and CCD Cameras, (25 March 1996); https://doi.org/10.1117/12.236116

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