Paper
1 April 1996 Multigigahertz relative intensity noise of an InGaAsP laser at cryogenic temperature
Gregory E. Obarski, Donald R. Larson, Robert J. Phelan Jr.
Author Affiliations +
Abstract
Using a well-characterized measurement system having 22 GHz bandwidth, we show that the relative intensity noise (RIN) of a commercial InGaAsP laser (multi-longitudinal mode) operating at 77 K is significantly reduced below room temperature values over a broad frequency range. For laser operation with equal drive currents at both temperatures, a RIN reduction of as high as approximately equal to 24 dB/Hz is observed in the frequency region of relaxation oscillations, while for operation with equal power outputs the maximum reduction observed is approximately equal to 14 dB/Hz.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gregory E. Obarski, Donald R. Larson, and Robert J. Phelan Jr. "Multigigahertz relative intensity noise of an InGaAsP laser at cryogenic temperature", Proc. SPIE 2684, High-Speed Semiconductor Laser Sources, (1 April 1996); https://doi.org/10.1117/12.236934
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KEYWORDS
Cryogenics

Silicon

Temperature metrology

Laser development

Liquids

Neodymium

Photodetectors

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