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10 January 1996 Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy
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Abstract
Atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM) were used to study optical fiber structures. The refractive index profile of fiber was disclosed by surface topography of etched fiber endface using a AFM. The difference of refractive index was resolved to 1 X 10-6. Near-field optical intensity distribution at fiber endface has been successfully measured by a tapping-mode force regulated SNOM. Combination of tapping-mode AFM and SNOM allowed us to image both refractive index and near-field intensity structures of fibers simultaneously. The correlation between waveguide structures and near-field propagating modes was directly provided by this novel method. Results of single mode fibers and fibers with anisotropic structures illustrated the usefulness of this technique.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Din Ping Tsai, Yueh Liang Chung, and Andreas Othonos "Study of optical fiber structures using atomic force microscopy and scanning near-field optical microscopy", Proc. SPIE 2695, Functional Photonic and Fiber Devices, (10 January 1996); https://doi.org/10.1117/12.229946
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