Ultrasensitive detection of photothermal signal of thin films by using an optical amplification system

S. T. Gu; Zhouling Wu; Peter Diehr; Y. S. Lu; Pao-Kuang Kuo

doi:10.1117/12.240368

27 May 1996 Ultrasensitive detection of photothermal signal of thin films by using an optical amplification system

S. T. Gu, Zhouling Wu, Peter Diehr, Y. S. Lu, Pao-Kuang Kuo

Author Affiliations +

Proceedings Volume 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995; (1996) https://doi.org/10.1117/12.240368
Event: Laser-Induced Damage in Optical Materials: 1995, 1995, Boulder, CO, United States

Abstract

A simple optical amplification system is introduced to improve the sensitivity of both the photothermal deflection detection scheme and the surface thermal lensing technique. Model calculations and experimental data show that the photothermal signals can be easily amplified by more than an order of magnitude and that the technique can be readily applied to weak absorption measurements for optical thin film coatings.

Citation Download Citation

S. T. Gu, Zhouling Wu, Peter Diehr, Y. S. Lu, and Pao-Kuang Kuo "Ultrasensitive detection of photothermal signal of thin films by using an optical amplification system", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); https://doi.org/10.1117/12.240368

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