Contrast Sensitivity In The Assessment Of Visual Instruments

Pantazis Mouroulis

doi:10.1117/12.931850

29 October 1981 Contrast Sensitivity In The Assessment Of Visual Instruments

Pantazis Mouroulis

Proceedings Volume 0274, Assessment of Imaging Systems II; (1981) https://doi.org/10.1117/12.931850
Event: Assessment of Imaging Systems: Visible and Infrared, 1981, Reading, United Kingdom

Abstract

The application of sine-wave contrast sensitivity as an image assessment tool is examined. The required sinusoidal targets are carefully specified and the construction method is briefly described. Problems associated with the measurements are discussed and an apparatus for the subjective testing of visual instruments is presented. The method is used to investigate the best correction of astigmatism and field curvature in a telescopic system.

Citation Download Citation

Pantazis Mouroulis "Contrast Sensitivity In The Assessment Of Visual Instruments", Proc. SPIE 0274, Assessment of Imaging Systems II, (29 October 1981); https://doi.org/10.1117/12.931850

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