Dynamic infrared scene projector temperature resolution

Owen M. Williams

doi:10.1117/12.242986

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17 June 1996 Dynamic infrared scene projector temperature resolution

Owen M. Williams

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Proceedings Volume 2742, Targets and Backgrounds: Characterization and Representation II; (1996) https://doi.org/10.1117/12.242986
Event: Aerospace/Defense Sensing and Controls, 1996, Orlando, FL, United States

Abstract

The factors influencing the attainment of fine simulated temperature resolution in a dynamic infrared scene projection system are examined. It is shown that the input data word bit resolution, the simulated temperature range requirement, the shape of the input word transfer function and the presence of spatial noise all affect the temperature resolution. Expressions are derived for allowing the simulated temperature resolution of both emissive projectors and spatial light modulator projectors to be estimated. Projector spatial noise is also analyzed in order to allow the noise limit on temperature resolution to be determined in terms of array nonuniformity. The array uniformity goals to which infrared projector manufacturers need to strive after nonuniformity correction procedures have been applied are therefore determined.

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Owen M. Williams "Dynamic infrared scene projector temperature resolution", Proc. SPIE 2742, Targets and Backgrounds: Characterization and Representation II, (17 June 1996); https://doi.org/10.1117/12.242986

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