Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths

Stefan Gliech; Angela Duparre

doi:10.1117/12.246758

19 August 1996 Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths

Stefan Gliech, Angela Duparre

Author Affiliations +

Proceedings Volume 2775, Specification, Production, and Testing of Optical Components and Systems; (1996) https://doi.org/10.1117/12.246758
Event: Optical Instrumentation and Systems Design, 1996, Glasgow, United Kingdom

Abstract

A total integrated scattering measurement set-up is described which enables the detection of scattered light within a spatial frequency range from 0.0041 micrometers^-1 to 4 micrometers^-1. The apparatus is based on a Coblentz sphere and is equipped with light sources in the wavelength range from the UV to IR. Examples are presented of measurements on samples with rms- roughnesses from angstroms to microns.

Citation Download Citation

Stefan Gliech and Angela Duparre "Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths", Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); https://doi.org/10.1117/12.246758

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available