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19 August 1996 Engineering of Z-Scan experimental configuration for fast characterization of nonlinear materials
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Abstract
An engineering of the Z-scan technique is proposed for a direct measurement of the nonlinear variation of the refractive index of optical materials. The proposed set-up is fast and it gives a real-time control of the experiment. The configuration is based on a fast oscillation of the sample across the focal point of a lens by which the whole experimental signal can be visualized at once on an oscilloscope. Direct digitalization of the oscillograms could increase the experimental sensitivity and gives an on- line control of the noise. In this way both optical and electrical noises can be identified and reduced by suitable filtering.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eugenio Fazio, Paolo Bevilacqua, and Mario Bertolotti "Engineering of Z-Scan experimental configuration for fast characterization of nonlinear materials", Proc. SPIE 2775, Specification, Production, and Testing of Optical Components and Systems, (19 August 1996); https://doi.org/10.1117/12.246742
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