Paper
19 August 1996 Polarizers at 1.053 um deposited on silica substrate for high-laser-flux applications in a vacuum
Bernard Geenen, Herve Leplan, B. Pinot, W. Alexandre, P. Pally, Larry A. Roussel, Odile Lam
Author Affiliations +
Abstract
The French Megajoule Project requires polarizers with high laser-induced damage thresholds. Such polarizers must be deposited on silica substrates, which are commonly prone to stress leading to early failure. Better stress control in the films require an optimization of the stack design as well as the deposition parameters. The thermal e-beam technique is used. We present the spectral behavior of such 1.03 micrometers polarizers in air and under vacuum at the Brewster incidence angle of 55 degrees 4 along with the damage test results.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernard Geenen, Herve Leplan, B. Pinot, W. Alexandre, P. Pally, Larry A. Roussel, and Odile Lam "Polarizers at 1.053 um deposited on silica substrate for high-laser-flux applications in a vacuum", Proc. SPIE 2776, Developments in Optical Component Coatings, (19 August 1996); https://doi.org/10.1117/12.246815
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Cited by 2 scholarly publications.
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KEYWORDS
Polarizers

Silica

Resistance

Laser damage threshold

Oxygen

Thin films

Laser applications

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