Measurement of the linear eletro-optic effect by reflection method in Mach-Zehnder interferometer

M. J. Shin

doi:10.1117/12.2316099

1 September 1996 Measurement of the linear eletro-optic effect by reflection method in Mach-Zehnder interferometer

M. J. Shin

Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 2778BE (1996) https://doi.org/10.1117/12.2316099
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of

Abstract

A Mach-Zehnder interferometer (MZI) is adopted to measure the linear electro-optic (EO) coefficient of the poled polymer film. EO effect is measured as a function of the optical bias, the modulation voltage, and the direction of polarization.

Citation Download Citation

M. J. Shin "Measurement of the linear eletro-optic effect by reflection method in Mach-Zehnder interferometer", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778BE (1 September 1996); https://doi.org/10.1117/12.2316099

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