PROCEEDINGS VOLUME 2782
LASERS, OPTICS, AND VISION FOR PRODUCTIVITY IN MANUFACTURING I | 10-14 JUNE 1996
Optical Inspection and Micromeasurements
Editor Affiliations +
LASERS, OPTICS, AND VISION FOR PRODUCTIVITY IN MANUFACTURING I
10-14 June 1996
Besancon, France
Plenary Papers
Jean-Pierre Goedgebuer, Henri Porte, Wilhelm Elflein
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250728
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250743
Microtopographic Inspection
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250754
Jose E. Calatroni, Patrick Sandoz, Gilbert M. Tribillon, Herve Perrin
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250765
Peter J. de Groot, Leslie L. Deck, James A. Soobitsky, James F. Biegen
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250775
Joerg Peters, Peter Lehmann, Armin Schoene
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250785
N. B. E. Sawyer, Chung Wah See, Michael G. Somekh
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250795
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250813
Sensors
Olivier Jerome Dussarrat, D. Fraser Clark, T. J. Moir
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250729
Laurent Vulliet, Nicoletta Casanova, Daniele Inaudi, Annette Osa-Wyser, Samuel Vurpillot
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250734
Bernhard Schmitz, Jurgen Geerkens, Gert Goch
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250735
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250736
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250737
Laurent Thiery, Jean-Pierre Prenel
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250738
Lionel Delaunay, Beatrice Payet
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250739
Displacement, Deformation, and Strain Measurements
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250740
Edoardo Mazza, Jurg Dual, C. R. Musil, Gaudenz Danuser, Martin Vetterli
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250741
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250742
Gaudenz Danuser, Edoardo Mazza
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250744
Johannes K. Schaller, Ernst Ulrich Wagemann, Christo G. Stojanoff
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250745
Peter Andrae, Manfred-Andreas Beeck, Werner P. O. Jueptner, Werner Nadeborn, Wolfgang Osten
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250746
Grating Interferometry and Related Topics
Holographic Metrology
Philippe Tatasciore, Hans-Reinhard Meyer-Piening
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250753
F. D. Schroeder, Horst-Artur Crostack
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250755
Zoltan Fuezessy, Ferenc Gyimesi, Bela Raczkevi, Janos P. Makai, Janos Kornis, Ildiko Laszlo
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250756
Rolf Rustad, Ole Johan Lokberg, Hans Magne Pedersen, Kristin Klepsvik, Trude Stoeren
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250757
George Eugene Dovgalenko, M. Shahid Haque, Anatoli Kniazkov, Yuri I. Onischenko, Gregory J. Salamo, Hameed A. Naseem
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250758
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250759
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250760
Fringe Pattern Analysis
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250761
Maria Pirga, Malgorzata Kujawinska
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250762
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250763
Thomas Wolf, Bernd Gutmann, H. Weber
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250764
Yasuhiko Arai, Shunsuke Yokozeki, Kazuhiro Shiraki, Tomoharu Yamada
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250766
Speckle Metrology
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250767
Roland Hoefling, Jaroslav Vaclavik, Reimund Neigebauer
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250768
Mathias Lehmann
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250769
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250770
Pierre R. Slangen, Patrick Ienny, Max Nemoz-Gaillard
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250771
New Approaches
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250772
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250773
Paul C. Montgomery, Jean-Marc Lussert
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250774
Philippe Delaye, Alain Blouin, Louis-Anne de Montmorillon, Ivan Biaggio, Denis Drolet, Jean-Pierre Monchalin, Gerald Roosen
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250776
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250777
Material Characterization
C. M. Chen, Q. Shan, Richard J. Dewhurst
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250778
Mario Bertolotti, Roberto Li Voti, Stefano Paoloni, Concita Sibilia, G. L. Liakhou
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250779
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250780
Near-Field Microscopy
J. Ferber, U. C. Fischer, J. Koglin, Harald Fuchs
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250781
Dominique Barchiesi, Christian Pieralli
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250782
Bernard Cretin, Etienne Farnault
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250783
Stephane Davy, G. Rachard, Michel Spajer
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250784
Daniel Van Labeke, A. Vial, Dominique Barchiesi
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250786
R. Bachelot, Ahmed Lahrech, Philippe Gleyzes, Albert Claude Boccara
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250787
Claudine Bainier, Daniel A. Courjon, J. Salvi, Fadi Baida, Christian Girard, Jean-Marie Vigoureux, A. Castiaux
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250788
Carlo Coluzza, J. Almeida, Tiziana Dell'Orto, O. Bergossi, Michel Spajer, Stephane Davy, Daniel A. Courjon, Antonio Cricenti, Renato Generosi, et al.
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250789
Specialized Techniques and Applications
Pia Kemppainen-Kajola, Juhani P. Hirvonen, Jyrki Laitinen, Kari Luukko, Markku Kansakoski
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250790
Klaus Andresen, Markus Neugebauer
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250791
Wolfgang Schreiber, Gunther Notni, Peter Kuehmstedt, Joerg Gerber, Richard M. Kowarschik
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250792
Peter Blattner, Hans Peter Herzig
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250793
Yueai Liu, Chung Wah See, Michael G. Somekh
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250794
Ilya Sh. Etsin, Lev N. Butenko
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250796
Poster Session
Boris F. Fyodorov
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250797
Roland Ritter, Michael Reick, Bernhard Schmitz, Gert Goch
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250798
Josep Massaneda, Francois Flory, Salvador Bosch, Jordi Martorell, Serge Monneret
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250799
Eric Bonnotte, L. Robert, Patrick Delobelle, Luc Bornier, Bertrand Trolard, Gilbert M. Tribillon, D. Mairey
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250800
F. Donatini, Jean Monin
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250801
Volker Kirschner, Wolfgang Schreiber, Gunther Notni, Richard M. Kowarschik
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250802
A. Krause, Martin Palme, Gunther Notni
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250803
Philippe Elies, Bernard Le Jeune, Jean-Pierre Marie, Jack Cariou, Jean Lotrian
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250804
Henning Rehn, Matthias Esselbach, Richard M. Kowarschik, Klaus H. Ringhofer
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250805
Henning Rehn, Gunther Notni, A. Krause, Burkhard Fleck, Armin Kiessling, Matthias Esselbach, Richard M. Kowarschik, Lutz Wenke
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250806
Maurice Patrick Whelan, Robert P. Kenny, John T. Sheridan, Constantin Th. Coutsomitros
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250807
Henri Gagnaire, Claude Brehm
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250808
Daniele Blanc, Alain Cachard, Jean Claude Pommier
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250809
Marcelo Trivi, Vincenzo Greco, Lois M. Hoffer, Giuseppe Molesini
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250810
Serguei A. Alexandrov, Igor V. Chernyh, Valery N. Korban
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250811
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250812
Dominique Barchiesi, Luis Belmar-Letelier, Daniel Van Labeke
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250814
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250815
German Ivanovych Il'in, Oleg G. Morozov, Yuri E. Pol'ski
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250816
Ravil R. Agishev, Ravil A. Bajazitov, Marat M. Galeyev
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250730
Fabrice Meriaudeau, L. Stubbs, Jim E. Parks Jr., K. Bruce Jacobson, Jean-Pierre Goudonnet, Trinidad L. Ferrell
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250731
New Approaches
Marc P. Georges, Philippe C. Lemaire
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250732
Poster Session
P. Dubief, J. J. Hunsinger, E. Gaffet
Proceedings Volume Optical Inspection and Micromeasurements, (1996) https://doi.org/10.1117/12.250733
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