Paper
18 September 1996 Interference refractometer and thickness meter
Serguei A. Alexandrov, Igor V. Chernyh, Valery N. Korban
Author Affiliations +
Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250811
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
The experimental model of laser interference refractometer and thicknessmeter (IRT) for simultaneous measurement of absolute refractive index and thickness of the plane parallel samples has been developed, manufactured and investigated. This IRT allows to test solid, liquid and gaseous media, including optical crystals, plastics and other sheet materials, over a wide spectral range. IRT accuracy of refractive index measurement is not worse than from the best modern goniometers and accuracy of thickness measurement corresponds to the interference accuracy.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Serguei A. Alexandrov, Igor V. Chernyh, and Valery N. Korban "Interference refractometer and thickness meter", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250811
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Cited by 1 scholarly publication.
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KEYWORDS
Crystal optics

Refractive index

Crystals

Laser development

Liquid crystals

Liquids

Manufacturing

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