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18 September 1996 Versatile scanning near-field optical microscope using an apertureless metallic probe
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Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250787
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
Theoretically, it is well known that the classical optical microscope resolution, is limited to about 250 nm. Actually, the scanning near-field optical microscopy allow to get over this limit. Using a vibrating opaque metallic tip, which periodically and locally perturbs the electromagnetic field distribution of a focused laser spot in to the sample surface, we have observed with better resolution than the theoretical limit many topographic and optical test object.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Bachelot, Ahmed Lahrech, Philippe Gleyzes, and Albert Claude Boccara "Versatile scanning near-field optical microscope using an apertureless metallic probe", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250787
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