Nonlinear effects in SEW excitation in Ag/fullerene thin film structures in Kretschmann configuration

N. N. Il'ichev; Yuriy Y. Petrov; V. A. Yakovlev

doi:10.1117/12.242126

10 June 1996 Nonlinear effects in SEW excitation in Ag/fullerene thin film structures in Kretschmann configuration

N. N. Il'ichev, Yuriy Y. Petrov, V. A. Yakovlev

Proceedings Volume 2801, Nonlinear Optics of Low-Dimensional Structures and New Materials; (1996) https://doi.org/10.1117/12.242126
Event: International Conference on Coherent and Nonlinear Optics, 1995, St. Petersburg, Russian Federation

Abstract

Dependence of minimum reflectivity angle on incidence light pulse energy at SEW excitation in Kretschmann's configuration was studied. CaF₂ prism covered by thin layers of Ag and fullerene was used. Optical constants of fullerene thin layer were found: (epsilon) ' equals 3.86, (epsilon) ' equals 0.013 at wavelength 1.055 micrometers .

Citation Download Citation

N. N. Il'ichev, Yuriy Y. Petrov, and V. A. Yakovlev "Nonlinear effects in SEW excitation in Ag/fullerene thin film structures in Kretschmann configuration", Proc. SPIE 2801, Nonlinear Optics of Low-Dimensional Structures and New Materials, (10 June 1996); https://doi.org/10.1117/12.242126

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