High-resolution grazing incidence x-ray spectrometer and its characteristics

Xianxin Zhong; Shaotang He

doi:10.1117/12.245087

19 July 1996 High-resolution grazing incidence x-ray spectrometer and its characteristics

Xianxin Zhong, Shaotang He

Proceedings Volume 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III; (1996) https://doi.org/10.1117/12.245087
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

A novel soft x-ray grazing incidence spectrometer for studying laser produced plasma has been developed. The spectrometer is a complex system which is composed of three units: a grazing incidence grating spectrography, 4 dimensions micro adjustment equipment, and an aligning system with optical fiber bundle, electronic camera, TV monitor and laser transit. The spectrograph is used to resolve the lines of a soft x-ray spectra. The extreme ultraviolet spectra (time-integrated) region in the wavelength of 2-32nm. The resolving resolution of the spectrograph is 0.005nm.

Citation Download Citation

Xianxin Zhong and Shaotang He "High-resolution grazing incidence x-ray spectrometer and its characteristics", Proc. SPIE 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III, (19 July 1996); https://doi.org/10.1117/12.245087

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