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12 October 1996 Imaging interferometric spectroscopy for advanced missions
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Abstract
Shearing interferometric spectrometers can be used for all- reflective, high-resolution (R equals 104 - 106) spectroscopy. The spectrometers can provide simultaneous imaging and be used for both sensitive emission and absorption spectroscopy of diffuse and point sources. Our designs require interaction with only a single optical element to create interference fringes and so can be used in the EUV and FUV (100 - 2000 angstroms) bandpass. Spectral interferometers consume a fraction of the volume required by conventional spectrographs with comparable resolution and consequently provide a promising technique for space missions.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jerry Edelstein "Imaging interferometric spectroscopy for advanced missions", Proc. SPIE 2807, Space Telescopes and Instruments IV, (12 October 1996); https://doi.org/10.1117/12.255101
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