Imaging interferometric spectroscopy for advanced missions

Jerry Edelstein

doi:10.1117/12.255101

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12 October 1996 Imaging interferometric spectroscopy for advanced missions

Jerry Edelstein

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Proceedings Volume 2807, Space Telescopes and Instruments IV; (1996) https://doi.org/10.1117/12.255101
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

Shearing interferometric spectrometers can be used for all- reflective, high-resolution (R equals 10⁴ - 10⁶) spectroscopy. The spectrometers can provide simultaneous imaging and be used for both sensitive emission and absorption spectroscopy of diffuse and point sources. Our designs require interaction with only a single optical element to create interference fringes and so can be used in the EUV and FUV (100 - 2000 angstroms) bandpass. Spectral interferometers consume a fraction of the volume required by conventional spectrographs with comparable resolution and consequently provide a promising technique for space missions.

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Jerry Edelstein "Imaging interferometric spectroscopy for advanced missions", Proc. SPIE 2807, Space Telescopes and Instruments IV, (12 October 1996); https://doi.org/10.1117/12.255101

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