Flight x-ray CCD selection for the AXAF CCD Imaging Spectrometer

Michael J. Pivovaroff; Steven E. Kissel; Mark W. Bautz; Gregory Y. Prigozhin; Takashi Isobe; Jonathan W. Woo; James A. Gregory

doi:10.1117/12.255993

31 October 1996 Flight x-ray CCD selection for the AXAF CCD Imaging Spectrometer

Michael J. Pivovaroff, Steven E. Kissel, Mark W. Bautz, Gregory Y. Prigozhin, Takashi Isobe, Jonathan W. Woo, James A. Gregory

Author Affiliations +

Proceedings Volume 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII; (1996) https://doi.org/10.1117/12.255993
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

As part of our program to select and calibrate flight- quality, x-ray CCD detectors for the AXAF CCD imaging spectrometer, we have developed efficient detector screening methods. Our screening protocol, which measures device-level performance parameters (including noise, dark current and charge transfer efficiency) as well as x-ray spectral resolution in the 0.3 - 6 keV band, allows us quickly to identify which of the greater than 30 flight candidate detectors warrant the expenditure of severely limited time available for calibration. The performance criteria used to rank devices are discussed, and the details of the measurement methods are presented. Summary results of the screening measurements are presented for a large sample of devices, and detailed data on selected devices are described. We find that the performance variations among the sample of flight devices to be relatively small but significant.

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Michael J. Pivovaroff, Steven E. Kissel, Mark W. Bautz, Gregory Y. Prigozhin, Takashi Isobe, Jonathan W. Woo, and James A. Gregory "Flight x-ray CCD selection for the AXAF CCD Imaging Spectrometer", Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); https://doi.org/10.1117/12.255993

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