Paper
31 October 1996 Light yield and Fano factor for x rays in xenon gas proportional scintillation counters
Filipa I. G. Melo Borges, Joaquim M. F. dos Santos, S. Kubota, Carlos Alberto Na Conde
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Abstract
The light yield, or electroluminescence yield, of pure xenon for reduced electric fields below the ionization threshold (about 6 Vcm-1torr-1) was measured for pressures of 825, 570 and 276 torr using a uniform field gas proportional scintillation counter excited with 5.9 keV x rays. A linear behavior was exhibited from the 1 Vcm-1torr-1 electroluminescence threshold, but the measured yield (for lambda greater than 165 nm) diminished with the gas pressure. The best energy resolution obtained was 7.6% for collimated 5.9 keV x rays with xenon at 825 torr. A Fano factor of 0.26 was measured for the three xenon pressures.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Filipa I. G. Melo Borges, Joaquim M. F. dos Santos, S. Kubota, and Carlos Alberto Na Conde "Light yield and Fano factor for x rays in xenon gas proportional scintillation counters", Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); https://doi.org/10.1117/12.256035
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KEYWORDS
Xenon

Scintillation

X-rays

Collimation

Electroluminescence

Ionization

Optical testing

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