Radiation damage of the x-ray CCD

Hiroshi Tomida; Hironori Matsumoto; Masanobu Ozaki; Yuji Tazawa; Hisamitsu Awaki; Takeshi G. Tsuru; Katsuji Koyama; Hiroshi Tsunemi; Koei Yamamoto

doi:10.1117/12.255999

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31 October 1996 Radiation damage of the x-ray CCD

Hiroshi Tomida, Hironori Matsumoto, Masanobu Ozaki, Yuji Tazawa, Hisamitsu Awaki, Takeshi G. Tsuru, Katsuji Koyama, Hiroshi Tsunemi, Koei Yamamoto

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Proceedings Volume 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII; (1996) https://doi.org/10.1117/12.255999
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

We studied the proton damage effects of the x-ray CCD. We have measured x-ray CCD performances after the irradiation of energies at 2 and 9.5 MeV, and confirmed clear degradation of charge transfer efficiency (CTE) and the energy resolution. To recover degraded CTE and the energy resolution, we tried the charge injection technique, and found the improvement of CTI and the energy resolution to be one-quarter and one-third, respectively. We also estimated the energy level of the deep trap, which causes the quantization of the dark current from the radiation-damaged pixels. The trap energy level is about 0.57 eV, or near the center of forbidden band.

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Hiroshi Tomida, Hironori Matsumoto, Masanobu Ozaki, Yuji Tazawa, Hisamitsu Awaki, Takeshi G. Tsuru, Katsuji Koyama, Hiroshi Tsunemi, and Koei Yamamoto "Radiation damage of the x-ray CCD", Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); https://doi.org/10.1117/12.255999

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