Simulation of the XMM mirror performance based on metrology data

Philippe Gondoin; Marco W. Beijersbergen; Richard Willingale; Daniel de Chambure; Kees van Katwijk; David H. Lumb; Anthony J. Peacock

doi:10.1117/12.256013

31 October 1996 Simulation of the XMM mirror performance based on metrology data

Philippe Gondoin, Marco W. Beijersbergen, Richard Willingale, Daniel de Chambure, Kees van Katwijk, David H. Lumb, Anthony J. Peacock

Author Affiliations +

Proceedings Volume 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII; (1996) https://doi.org/10.1117/12.256013
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The high throughput x-ray spectroscopy mission (XMM) is a 'cornerstone' project in the ESA Long-Term Programme for Space Science. The satellite observatory uses three grazing incidence mirror modules coupled to reflection grating spectrometers and x-ray CCD cameras. In order to achieve a large effective area, each XMM mirror module consists of 58 Wolter I mirrors which are nested in a coaxial and cofocal configuration. Each mirror shell is characterized by detailed metrology before further integration into the mirror modules. The present paper describes the mirror metrology and the way metrology data will be used to simulate the mirror performance. Simulation results are compared with x-ray images.

Citation Download Citation

Philippe Gondoin, Marco W. Beijersbergen, Richard Willingale, Daniel de Chambure, Kees van Katwijk, David H. Lumb, and Anthony J. Peacock "Simulation of the XMM mirror performance based on metrology data", Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); https://doi.org/10.1117/12.256013

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