Beam deflection apparatus with high resolution for monitoring TGS crystal growth

Sergio Musazzi; A. Affinito; Christian Stenzel; G. Fabritius

doi:10.1117/12.244341

12 July 1996 Beam deflection apparatus with high resolution for monitoring TGS crystal growth

Sergio Musazzi, A. Affinito, Christian Stenzel, G. Fabritius

Proceedings Volume 2809, Space Processing of Materials; (1996) https://doi.org/10.1117/12.244341
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

A beam deflection apparatus with a high resolution has been developed which allows monitoring of temperature and concentration gradients in the region around a TGS (triglycine sulphate) crystal growing from an aqueous solution. The developed optical setup consists of two measuring arms that allow inspection of the test region along two perpendicular directions. With a lateral position sensing device the deflection of a mildly focused laser beam traversing the medium to be tested have been measured along one inspection axis, while a 2D analysis of the test region is performed in the orthogonal direction by means of a properly focused light blade and a CCD camera. Experimental verification of the technique has been performed utilizing TGS crystal growth by means of the 'cooled sting' method. The experiment takes place in a double-wall glass cell, the temperature of the TGS crystal can be adjusted independently from the solution temperature. Systematic measurements have been performed which allow to characterize concentration gradients and thermal convection in the vicinity of the crystal. Analysis of experimental results shows the high sensitivity of this method. This technique is well suited as a diagnostic tool for monitoring and controlling crystal growth experiments in microgravity.

Citation Download Citation

Sergio Musazzi, A. Affinito, Christian Stenzel, and G. Fabritius "Beam deflection apparatus with high resolution for monitoring TGS crystal growth", Proc. SPIE 2809, Space Processing of Materials, (12 July 1996); https://doi.org/10.1117/12.244341

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