Required composition uniformity of Hg1-xCdxTe substrate for focal plane arrays

Vishnu Gopal

doi:10.1117/12.255169

22 October 1996 Required composition uniformity of Hg1-xCdxTe substrate for focal plane arrays

Vishnu Gopal

Proceedings Volume 2816, Infrared Detectors for Remote Sensing: Physics, Materials, and Devices; (1996) https://doi.org/10.1117/12.255169
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

This paper presents a comparison of theoretically predicted spatial NETD and mean temporal NETD as a function of the composition uniformity of Hg_1-xCd_xTe substrate used in the fabrication of IR detector arrays. The prediction of the spatial NETD is based on the residual spatial noise left behind in the FPA after implementing a linear two point nonuniformity compensation algorithm. The effect of using an optical filter on the spatial NETD is also included to show that the specifications on the composition uniformity of the Hg_1-xCd_xTe substrate can be partially relaxed by using an optical filter whose cut-off wavelength is less than the cutoff wavelength of the photodiodes of mean response. The composition uniformity leading to temporal noise rather than the spatial noise limited performances are suggested to be indicating the required composition uniformity of Hg_1-xCd_xTe substrate for focal plane arrays (FPA). The results are presented for both MWIR and LWIR HgCdTe hybrid FPAs.

Citation Download Citation

Vishnu Gopal "Required composition uniformity of Hg1-xCdxTe substrate for focal plane arrays", Proc. SPIE 2816, Infrared Detectors for Remote Sensing: Physics, Materials, and Devices, (22 October 1996); https://doi.org/10.1117/12.255169

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