Paper
29 December 1981 Epitaxial HgCdTe/CdTe Photodiodes For The 1 To 3 μm Spectral Region
J. G. Pasko, S. H. Shin, D. T. Cheung
Author Affiliations +
Proceedings Volume 0282, Technical Issues in Focal Plane Development; (1981) https://doi.org/10.1117/12.931977
Event: 1981 Technical Symposium East, 1981, Washington, D.C., United States
Abstract
Hgl_xCdx/cTe epitaxial layers have been successfully grown in various compositions, for 1-3 μm applications. n+/p junctions are formed either by a standard B-implantation into as-grown p-type layers or by doubly grown p- and n-layers. The SWIR HgCdTe photodiodes exhibit quantum efficiencies of 55-65% without AR coating. For the diodes with 1.39 μm cut-off at room temperature, the zero bias detector resistance-area (RοA) product is 4 x 104 Q-cm2, and the dark current density is - 1 x 10-4 Ω-cm2 at half-breakdown voltage. The same values of - 104 Ω-cm2 RoA products have also been measured for 2.4 μm cut-off photodiodes at 195K. The energy gap and temperature dependence of RoA product is in excellent agreement with the bulk limited generation-recombination model. The breakdown voltages of SWIR diodes vary from 12 volts to greater than 130 volts, depending on the Cd composition (x) and base carrier concentrations.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. G. Pasko, S. H. Shin, and D. T. Cheung "Epitaxial HgCdTe/CdTe Photodiodes For The 1 To 3 μm Spectral Region", Proc. SPIE 0282, Technical Issues in Focal Plane Development, (29 December 1981); https://doi.org/10.1117/12.931977
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KEYWORDS
Mercury cadmium telluride

Photodiodes

Sensors

Diodes

Liquid phase epitaxy

Short wave infrared radiation

Mercury

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