Application of near-infrared TDLAS systems to HF measurements in aluminum smelters

Harold I. Schiff; Sasha D. Nadler; John T. Pisano; Gervase I. Mackay

doi:10.1117/12.255326

21 October 1996 Application of near-infrared TDLAS systems to HF measurements in aluminum smelters

Harold I. Schiff, Sasha D. Nadler, John T. Pisano, Gervase I. Mackay

Proceedings Volume 2834, Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring; (1996) https://doi.org/10.1117/12.255326
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The LASIR system of instruments provide a way of measuring specific pollutants with no interferences form other gases. Since they are based on laser diodes operating in the communication region of the near infrared, they are rugged, easy to operate and relatively small and inexpensive. The instrument can be located in any desired location where it is free of environmental constraints and is readily available for servicing if required. The monitoring beam is transmitted to the measuring location by fiber optics. In some configurations the delivery optics contain no electrical components and can be placed in explosive or hazardous locations. These measurements locations can be up to several kilometers distant from the control. Three versions of the LASIR are available, (1) the LASIR-R for perimeter or area ambient air monitoring, (2) the LASIR-P for point source measurements, and (3) the LASIR-S for in stack monitoring. Multiplexing can be used to operate, simultaneously, a combination of a number of these versions for mt he same instrument at a number of locations, and if desired, with a variety of different lasers. Examples of the application of these system for measuring HF in aluminum smelters have shown that there is ample sensitivity to measure HF both in the stacks and in the pot-rooms of these smelters.

Citation Download Citation

Harold I. Schiff, Sasha D. Nadler, John T. Pisano, and Gervase I. Mackay "Application of near-infrared TDLAS systems to HF measurements in aluminum smelters", Proc. SPIE 2834, Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring, (21 October 1996); https://doi.org/10.1117/12.255326

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available