Paper
26 November 1996 In-situ ammonia analyzer for process control and environmental monitoring
Garth Monlux, Joel A. Brand, Patrick Zmarzly, M. Walker, K. W. Groff, Gregory J. Fetzer, Neil Goldstein, Fritz Bien, Steven C. Richtsmeier, Jamine Lee
Author Affiliations +
Abstract
An ammonia monitor designed for in situ smoke stack or exhaust duct applications is discussed here. A probe composed of a diffusion cell with a protected multipass optical measurement cavity provides the optical interaction with the sample. Other components of the system include signal processing electronics and an embedded PC104 computer platform. This instrument is useful in a wide variety of ammonia monitoring and process control applications, particularly ammonia-based NOx control technologies, such as selective catalytic reduction (SCR) and selective non-catalytic reduction (SNCR). The in situ design eliminates sample handling problems, associated with extractive analysis of ammonia, such as sample line adsorption and heated sample trains and cells. The sensor technology exploited in this instrument is second harmonic spectroscopy using a near infrared diode laser. Data collected during field trials involving both SCR and SNCR applications demonstrate the feasibility and robust operation of this instrument in traditionally problematic operating environments. The instrument can measure other gases by changing the wavelength, either by changing the diode operational set point or by changing the diode. In addition, with straightforward modification the instrument can measure multiple species.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Garth Monlux, Joel A. Brand, Patrick Zmarzly, M. Walker, K. W. Groff, Gregory J. Fetzer, Neil Goldstein, Fritz Bien, Steven C. Richtsmeier, and Jamine Lee "In-situ ammonia analyzer for process control and environmental monitoring", Proc. SPIE 2835, Advanced Technologies for Environmental Monitoring and Remediation, (26 November 1996); https://doi.org/10.1117/12.259776
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Cited by 3 scholarly publications.
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KEYWORDS
Signal processing

Signal detection

Sensors

Absorption

Calibration

Process control

Semiconductor lasers

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