Paper
1 November 1996 Dry resist technology to fabricate optimized microlenses centered to the end of a monomode fiber with electron-beam lithography
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Abstract
The fabrication of microlenses on flat and three-dimensional substrates is described. A totally dry resist process is used. The characteristics of this novel process are investigated. A technique for lens positioning and exposure was developed for a scanning electron microscope using an image processor as a beam control system. The hyperbolic profile of the microlenses is computer generated. Microlenses of cylindrical, round, and elliptical geometry were fabricated on a Si wafer and on the end of a monomode quartz fiber. Focusing of infrared light by fabricated microlenses is demonstrated.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey V. Babin, Mark A. Weber, and Hans W. P. Koops "Dry resist technology to fabricate optimized microlenses centered to the end of a monomode fiber with electron-beam lithography", Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996); https://doi.org/10.1117/12.256212
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KEYWORDS
Microlens

Single mode fibers

Lithography

Quartz

Photoresist processing

Scanning electron microscopy

Silicon

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