Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS

Robert J. Brown; James R. Houck

doi:10.1117/12.256232

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1 November 1996 Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS

Robert J. Brown, James R. Houck

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Proceedings Volume 2863, Current Developments in Optical Design and Engineering VI; (1996) https://doi.org/10.1117/12.256232
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The optical design of a dual path imaging spectrometer and peak up camera for the IRS instrument on the SIRTF mission is discussed. The dual path configuration allows for a single area array to be simultaneously used for both low resolution spectroscopy and high resolution imagery without overlapping. This is accomplished by the use of off-axis reflective Schmidt cameras in each optical path. These cameras provide a high resolution image and a low resolution spectral image that reside side-by-side on the focal plane without residing side-by-side in the object field.

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Robert J. Brown and James R. Houck "Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS", Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996); https://doi.org/10.1117/12.256232

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