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1 November 1996 Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS
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The optical design of a dual path imaging spectrometer and peak up camera for the IRS instrument on the SIRTF mission is discussed. The dual path configuration allows for a single area array to be simultaneously used for both low resolution spectroscopy and high resolution imagery without overlapping. This is accomplished by the use of off-axis reflective Schmidt cameras in each optical path. These cameras provide a high resolution image and a low resolution spectral image that reside side-by-side on the focal plane without residing side-by-side in the object field.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert J. Brown and James R. Houck "Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS", Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996);


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