Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS

Robert J. Brown; James R. Houck; Jeffrey E. Van Cleve

doi:10.1117/12.256226

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1 November 1996 Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS

Robert J. Brown, James R. Houck, Jeffrey E. Van Cleve

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Proceedings Volume 2863, Current Developments in Optical Design and Engineering VI; (1996) https://doi.org/10.1117/12.256226
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The optical design of a breadboard high resolution infrared spectrometer for the IRS instrument on the SIRTF mission is discussed. The spectrometer uses a crossed echelle grating configuration to cover the spectral region from 10 to 20 micrometer with a resolving power of approximately equals 600. The all reflective spectrometer forms a nearly diffraction limited image of the two dimensional spectrum on a 128 multiplied by 128 arsenic doped silicon area array with 75 micrometer pixels. The design aspects discussed include, grating numerology, image quality, packaging and alignment philosophy.

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Robert J. Brown, James R. Houck, and Jeffrey E. Van Cleve "Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS", Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996); https://doi.org/10.1117/12.256226

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