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1 November 1996 Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS
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The optical design of a breadboard high resolution infrared spectrometer for the IRS instrument on the SIRTF mission is discussed. The spectrometer uses a crossed echelle grating configuration to cover the spectral region from 10 to 20 micrometer with a resolving power of approximately equals 600. The all reflective spectrometer forms a nearly diffraction limited image of the two dimensional spectrum on a 128 multiplied by 128 arsenic doped silicon area array with 75 micrometer pixels. The design aspects discussed include, grating numerology, image quality, packaging and alignment philosophy.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert J. Brown, James R. Houck, and Jeffrey E. Van Cleve "Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS", Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996);

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