Paper
20 November 1996 Aging tests of high-power diode lasers as a basis for an international lifetime standard
Friedhelm Dorsch, Franz X. Daiminger
Author Affiliations +
Proceedings Volume 2870, Third International Workshop on Laser Beam and Optics Characterization; (1996) https://doi.org/10.1117/12.259922
Event: Third International Workshop on Laser Beam and Optics Characterization, 1996, Quebec City, Canada
Abstract
Higher power laser diodes have been aged under various operating conditions to gain information on the long-term output power behavior. In particular, the degradation of cw diode lasers that are operated at constant output power or at a constant driving current are compared to each other. It turns out that the lifetime results and their comparability strongly depend on the 'end-of-life' criterion. Especially for constant power operation extrapolation of the lifetime for longer intervals might give inconsistent results if the degradation of threshold current and slope efficiency are not known. Aging tests at increased temperature have been performed to investigate whether accelerated lifetime tests give reliable results to estimate lifetime and degradation rate at nominal operating conditions.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Friedhelm Dorsch and Franz X. Daiminger "Aging tests of high-power diode lasers as a basis for an international lifetime standard", Proc. SPIE 2870, Third International Workshop on Laser Beam and Optics Characterization, (20 November 1996); https://doi.org/10.1117/12.259922
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Cited by 14 scholarly publications.
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KEYWORDS
Semiconductor lasers

Diodes

High power diode lasers

High power lasers

Laser damage threshold

Optics manufacturing

Continuous wave operation

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