Method of measure the thickness of liquid crystal layer using phase plate

Masami Ito; Atsushi Fukui; Kanji Nishii; Kenji Takamoto

doi:10.1117/12.246256

16 August 1996 Method of measure the thickness of liquid crystal layer using phase plate

Masami Ito, Atsushi Fukui, Kanji Nishii, Kenji Takamoto

Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246256
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan

Abstract

The measurement of thickness of the liquid crystal layer has been done using the optical interference method with spectrophotometer up to now. But it took more than one minute to measure the thickness, and in-line measurement was impossible. So, in this paper, the measuring method of the thickness of the liquid crystal layer that it is possible to measure the thickness at high speed for about one second is proposed, and it is reported about the principle. And we report the comparison experimental results with this method and conventional method.

Citation Download Citation

Masami Ito, Atsushi Fukui, Kanji Nishii, and Kenji Takamoto "Method of measure the thickness of liquid crystal layer using phase plate", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); https://doi.org/10.1117/12.246256

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