You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
24 September 1996Intersubband lasing in silicon-based multiple quantum wells
Because of the absence of polar optical scattering, the lifetime difference of the upper and lower lasing levels, to which population inversion and laser gain are proportional, is an order of magnitude larger in silicon-based structures than in the III-Vs. Further enhancements are due to phonon confinement. For lasing wavelengths 10 micrometers and longer, GexSi1-x/Si is used. For operation at near infrared wavelengths, high barrier materials are needed. To avoid large operating voltages, designs are considered which rely on parallel rather than sequential operation.
The alert did not successfully save. Please try again later.
Gregory Sun, Jacob B. Khurgin, Lionel R. Friedman, Richard A. Soref, "Intersubband lasing in silicon-based multiple quantum wells," Proc. SPIE 2886, Semiconductor Lasers II, (24 September 1996); https://doi.org/10.1117/12.251876