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29 October 1981 High Frequency Modulation Interferometric Study Of Electron Stimulated Infrared (IR) Luminescence In InSb
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Proceedings Volume 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy; (1981) https://doi.org/10.1117/12.932134
Event: 1981 International Conference on Fourier Transform Infrared Spectroscopy, 1981, Columbia, United States
Abstract
The use of high frequency differential interferometry makes it possible to extract very weak signals from a large unmodulated background, as was first shown in transmission studies of circular vibrational dichroism. We have combined this technique with a liquid nitrogen cooled interferometer (modified Digilab Model 14B) and a liquid helium cooled Ge:Cu detector to detect the weak luminescence (≤10-9 watt) between 1700-2000 cm-1 emitted during bombardment by low energy electrons (0.8 mA @ 100 to 500 eV, frequency 10 KHz) of a single crystal of n-doped InSb (⪅ 1014-carriers/cm3) at 80K. For an absolute signal of 10-10 watt, our signal-to-noise ratio for 100 scans is (≈1O-50 for respective resolutions of 2-16 cm-1 while the overall background above 1000 cm-1 is ≈105 times larger. Without modulation the signal-to-noise ratio is one to two orders of magnitude lower. From our results it is clear that a substantial improvement in signal-to-noise ratio can be obtained in emission studies where the mechanism is fast enough to respond to high chopping frequencies such as electron or photon stimulated luminescence, field modulated emission and fast chemiluminescence.
© (1981) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. J. Chabal, D. L. Allara, D. Teicher, and J. E. Rowe "High Frequency Modulation Interferometric Study Of Electron Stimulated Infrared (IR) Luminescence In InSb", Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); https://doi.org/10.1117/12.932134
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