Reflectivity from multiple quantum well modulator with contrast ratio of 22:1 at 1.55 um

John E. Cunningham; Joseph Earl Ford; William Jan; R. N. Pathak

doi:10.1117/12.253206

30 September 1996 Reflectivity from multiple quantum well modulator with contrast ratio of 22:1 at 1.55 um

John E. Cunningham, Joseph Earl Ford, William Jan, R. N. Pathak

Proceedings Volume 2891, Integrated Optoelectronics; (1996) https://doi.org/10.1117/12.253206
Event: Photonics China '96, 1996, Beijing, China

Abstract

We demonstrate the performance of InGaAs/InP multiple quantum well modulators for fiber access applications. On/off contrast ratios in reflectivity are 22:1 with a 10:1 level extending over a 26 nm bandwidth at 1.55 micrometers . The methodology to produce such devices is described within.

Citation Download Citation

John E. Cunningham, Joseph Earl Ford, William Jan, and R. N. Pathak "Reflectivity from multiple quantum well modulator with contrast ratio of 22:1 at 1.55 um", Proc. SPIE 2891, Integrated Optoelectronics, (30 September 1996); https://doi.org/10.1117/12.253206

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