Paper
24 September 1996 Analysis and compensation of the measurement error in a lock-in amplifier used for wavelength shift measurement
Wen-Jiang Shi, Yanong N. Ning, Kenneth T. V. Grattan, Andrew W. Palmer, Shanglian Huang
Author Affiliations +
Proceedings Volume 2895, Fiber Optic Sensors V; (1996) https://doi.org/10.1117/12.252140
Event: Photonics China '96, 1996, Beijing, China
Abstract
The phase measurement error in an interferometric wavelength shift measurement scheme, such as that used in association with in-fiber Bragg grating sensors, has been investigated experimentally, with appropriate underpinning analytical theory. It has been shown that when a lock-in amplifier is employed to detect the phase shift generated by the Bragg wavelength shift, a pseudo-periodical measurement error can be introduced due to the difference between the amplitude of the optical path difference ramp and the value of Bragg wavelength. If the initial ramp deviation equals 20 nm, the measurement error may be as large as 5% of the total measurement range. By using a double-phase lock-in amplifier approach to measure the AC strain, the measurement error can be decreased to 0.4% of the total measurement range. By using the real-time measured period which corresponds to the Bragg wavelength with the distorted carrier signal of the interferometer as the reference period of a digital lock-in amplifier, the effect of the initial ramp deviation can be principally avoided, and the measurement error can be kept to an acceptably low level, about 0.1% of the total measurement range.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wen-Jiang Shi, Yanong N. Ning, Kenneth T. V. Grattan, Andrew W. Palmer, and Shanglian Huang "Analysis and compensation of the measurement error in a lock-in amplifier used for wavelength shift measurement", Proc. SPIE 2895, Fiber Optic Sensors V, (24 September 1996); https://doi.org/10.1117/12.252140
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KEYWORDS
Optical amplifiers

Amplifiers

Error analysis

Sensors

Signal detection

Interferometers

Distortion

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