Paper
3 October 1996 Large-scale flourine-doped textured transparent conducting SnO2 films deposited by APCVD
Honglei Ma, Deheng Zhang, Youpeng Chen, Shuying Li, Jin Ma, Fujian Zong
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Abstract
Large scale (30 by 30 cm) transparent conducting F-doped textured SnO2 films have been prepared by atmosphere pressure chemical vapor deposition (APCVD). Uniformly polycrystalline SnO2:F films having a variable preferred orientation have been obtained with resistivity as low as 5 multiplied by 10-4 (Omega) cm, with carrier concentrations between 3.5 multiplied by 1020 and 7 multiplied by 1020 cm-3 and Hall mobilities from 15.7 to 20.1 cm2 V/s. The average transmittance (including diffusion transmittance) is higher than 90% in the wavelength range of the visible spectrum and the maximum infrared reflectance reaches 92% for a film 655 nm thick. Substrate temperature, fluorine flow rate are main parameters affecting sheet resistance and transmittance of the resulting films. Oxygen flow rate also influences the film quality in some extent.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Honglei Ma, Deheng Zhang, Youpeng Chen, Shuying Li, Jin Ma, and Fujian Zong "Large-scale flourine-doped textured transparent conducting SnO2 films deposited by APCVD", Proc. SPIE 2897, Electro-Optic and Second Harmonic Generation Materials, Devices, and Applications, (3 October 1996); https://doi.org/10.1117/12.252947
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KEYWORDS
Fluorine

Transmittance

Oxygen

Crystals

Diffusion

Transparent conducting films

Reflectivity

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