Comprehensive test of low-level-light image intensifiers

Yu Liu; Yueqin Ma; Junyan Jiang; Jifang Shi

doi:10.1117/12.253086

3 October 1996 Comprehensive test of low-level-light image intensifiers

Yu Liu, Yueqin Ma, Junyan Jiang, Jifang Shi

Proceedings Volume 2899, Automated Optical Inspection for Industry; (1996) https://doi.org/10.1117/12.253086
Event: Photonics China '96, 1996, Beijing, China

Abstract

A comprehensive test system with unitary light source is described, which is a combination structure. The system can provide the whole function of formerly several common instruments for the test of image tubes. It can test the light quantum parameters, such as photo cathode sensitivity, luminance gain, automatic brightness control specification, equivalent background input, signal-to-noise ratio and output brightness uniformity, and geometry parameters, such as resolution, distortion, image alignment and magnification. The measuring uncertainty of the parameters is 1.7 percent to approximately 3.7 percent. The total uncertainty of system is 4.6 percent. On the basis of the structure designed, the system can be developed to an automatic instrument for testing the optical-electric performance of low-level-light image intensifiers.

Citation Download Citation

Yu Liu, Yueqin Ma, Junyan Jiang, and Jifang Shi "Comprehensive test of low-level-light image intensifiers", Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); https://doi.org/10.1117/12.253086

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