CT-assisted metrology for manufacturing applications

Robert N. Yancey; Dennis S. Eliasen; Roosevelt Gibson; Robert Dzugan

doi:10.1117/12.259203

15 November 1996 CT-assisted metrology for manufacturing applications

Robert N. Yancey, Dennis S. Eliasen, Roosevelt Gibson, Robert Dzugan

Author Affiliations +

Proceedings Volume 2948, Nondestructive Evaluation for Process Control in Manufacturing; (1996) https://doi.org/10.1117/12.259203
Event: Nondestructive Evaluation Techniques for Aging Infrastructure and Manufacturing, 1996, Scottsdale, AZ, United States

Abstract

Computed tomography (CT) has been shown to be an excellent nondestructive evaluation tool for measuring internal and external dimensions of manufactured components. Recent advances in CT-based metrology allow for CT data to be processed efficiently to produce full 3D models of scanned parts. This paper will talk about a number of applications for this technology including linking CT with rapid prototyping methods, using CT and rapid prototyping to produce rapid tooling, using CT as a metrology tool in a production environment, and linking CT data with engineering analysis. The paper will provide an overview of the current state of the art in applying CT-based metrology to manufacturing applications, will discuss actual application case studies, and highlight areas for future work in this area.

Citation Download Citation

Robert N. Yancey, Dennis S. Eliasen, Roosevelt Gibson, and Robert Dzugan "CT-assisted metrology for manufacturing applications", Proc. SPIE 2948, Nondestructive Evaluation for Process Control in Manufacturing, (15 November 1996); https://doi.org/10.1117/12.259203

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