Translator Disclaimer
Paper
20 December 1996 Birefringence determination in ion-exchanged waveguides
Author Affiliations +
Proceedings Volume 2954, Fiber Integrated Optics; (1996) https://doi.org/10.1117/12.262434
Event: Advanced Imaging and Network Technologies, 1996, Berlin, Germany
Abstract
Birefringence as high as 10-2 + 10-3 in ion-exchanged planar waveguides has been measured by using a double Lloyd's interferometer. Birefringence seems to be produced by the distribution of the mechanical stresses induced during the fabrication process. A new point-by-point calculation to fit the experimental data is proposed which can give new information about the ion-diffusion process and the stress distribution.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mario Bertolotti, W. A. Ramadan, F. Monteleone, Eugenio Fazio, Stefano Pelli, and Giancarlo C. Righini "Birefringence determination in ion-exchanged waveguides", Proc. SPIE 2954, Fiber Integrated Optics, (20 December 1996); https://doi.org/10.1117/12.262434
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
Back to Top