Paper
17 December 1996 Fast algorithm for spectral mixture analysis of imaging spectrometer data
Theo E. Schouten, Maurice S. Klein Gebbinck, Z. K. Liu, Shaowei Chen
Author Affiliations +
Abstract
Imaging spectrometers acquire images in many narrow spectral bands but have limited spatial resolution. Spectral mixture analysis (SMA) is used to determine the fractions of the ground cover categories (the end-members) present in each pixel. In this paper a new iterative SMA method is presented and tested using a 30 band MAIS image. The time needed for each iteration is independent of the number of bands, thus the method can be used for spectrometers with a large number of bands. Further a new method, based on K-means clustering, for obtaining endmembers from image data is described and compared with existing methods. Using the developed methods the available MAIS image was analyzed using 2 to 6 endmembers.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Theo E. Schouten, Maurice S. Klein Gebbinck, Z. K. Liu, and Shaowei Chen "Fast algorithm for spectral mixture analysis of imaging spectrometer data", Proc. SPIE 2955, Image and Signal Processing for Remote Sensing III, (17 December 1996); https://doi.org/10.1117/12.262887
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KEYWORDS
Shape memory alloys

Spectroscopy

Error analysis

Vegetation

Visualization

Principal component analysis

Soil science

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