Use of the Muller matrix for calculating the polarization characteristics of semiconductor thermal emission

Vasiliy A. Morozhenko; Alexej G. Kollyukh; R. Merker

doi:10.1117/12.266825

6 February 1997 Use of the Muller matrix for calculating the polarization characteristics of semiconductor thermal emission

Vasiliy A. Morozhenko, Alexej G. Kollyukh, R. Merker

Author Affiliations +

Proceedings Volume 2968, Optical Organic and Semiconductor Inorganic Materials; (1997) https://doi.org/10.1117/12.266825
Event: International Conference on Advanced Optical Materials and Devices, 1996, Riga, Latvia

Abstract

The influence of a magnetic field on the polarization characteristics of thermal radiation emitted by isotropic semiconductors was investigated theoretically. It was shown that thermal emission is polarized and the degree of polarization depends on the applied magnetic field and experiment geometry. Muller matrix formalism was used firstly for the decision of such problems.

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Vasiliy A. Morozhenko, Alexej G. Kollyukh, and R. Merker "Use of the Muller matrix for calculating the polarization characteristics of semiconductor thermal emission", Proc. SPIE 2968, Optical Organic and Semiconductor Inorganic Materials, (6 February 1997); https://doi.org/10.1117/12.266825

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