Paper
27 March 1997 Destruction of silicon and copper surface under pulsed and pulse periodic action of YAG:Nd laser
Alexander F. Banishev, Elena A. Baliikina
Author Affiliations +
Abstract
The paper presents the results of the study of silicon and copper surface destruction under pulsed and pulse-periodic action of YAG:Nd laser radiation. The anomalies have been discovered in the probe beam of He-Ne laser scattered from the silicon surface under its irradiation with a series of YAG:Nd laser pulses at I less than Imelt. (where Imelt. is the surface melting threshold). These anomalies are supposedly related to formation of surface layer saturated with defects.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander F. Banishev and Elena A. Baliikina "Destruction of silicon and copper surface under pulsed and pulse periodic action of YAG:Nd laser", Proc. SPIE 2993, Lasers as Tools for Manufacturing II, (27 March 1997); https://doi.org/10.1117/12.270025
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KEYWORDS
Pulsed laser operation

Silicon

Laser scattering

Semiconductor lasers

Copper

Scattering

Helium neon lasers

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