Operational stability of 980-nm pump lasers at 200 mW and above

Albert Oosenbrug; Abram Jakubowicz

doi:10.1117/12.273836

1 May 1997 Operational stability of 980-nm pump lasers at 200 mW and above

Albert Oosenbrug, Abram Jakubowicz

Proceedings Volume 3004, Fabrication, Testing, and Reliability of Semiconductor Lasers II; (1997) https://doi.org/10.1117/12.273836
Event: Photonics West '97, 1997, San Jose, CA, United States

Abstract

The understanding of failure mechanisms in InGaAs/AlGaAs 980 nm pump lasers has gained significantly in the last couple of years. Random failure reduction has been observed as a result of improved facet-passivation techniques, and improved packaging and chip technology. With todays wear-out extrapolation data and random-failure activation estimates, there is clearly outlook for operation at higher output- power levels (200 - 250 mW) than used so far at reasonably low random-failure rates and low failure-rate operation at lower power levels (e.g. 60 mW, 25 degree(s)C, towards 25 FIT?), which clearly stimulates the interest for application of 980 nm pumps in submarine applications.

Citation Download Citation

Albert Oosenbrug and Abram Jakubowicz "Operational stability of 980-nm pump lasers at 200 mW and above", Proc. SPIE 3004, Fabrication, Testing, and Reliability of Semiconductor Lasers II, (1 May 1997); https://doi.org/10.1117/12.273836

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