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20 June 1997 Bidirectional reflectance measurements for high-resolution signature modeling
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Improvements in the fidelity of predictive computer models have brought requirements for more robust reflectance modeling. These requirements have focused new interest in measurement processes and data representation. Representation of the data is of critical importance to rendering models such as ray tracers and radiance renders. In these cases concise and accurate reflectance representation drives speed performance of the modeling. Many types of reflectance representations exist but the bidirectional reflectance is the most general case, from which all the others can be derived. This paper explores the bidirectional reflectance function, its measurement techniques and linkages into predictive modeling. Limitations to each of these areas will also be discussed.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Thomas, James C. Jafolla, and Peter J. Sarman "Bidirectional reflectance measurements for high-resolution signature modeling", Proc. SPIE 3062, Targets and Backgrounds: Characterization and Representation III, (20 June 1997);

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