Translator Disclaimer
Paper
20 June 1997 Sensor- and detection-algorithm-based clutter metrics
Author Affiliations +
Abstract
Clutter metrics are important image measures for evaluating the expected performance of sensors and detection algorithms. Typically, clutter metrics attempt to measure the degree to which background objects resemble targets. That is, the more target-like objects or attributes in the background the higher the clutter level. However, it is critically important that the characteristics of the sensor systems and the detection algorithms be included in any measure of clutter. For example, clutter to a coarse resolution sensor coupled with a pulse thresholding detection algorithm is not necessarily clutter to a second generation FLIR with a man in the loop. Using present state- of-the-art first and second order clutter metrics and respective performance studies, a new class of sensor/algorithm clutter metrics will be derived which explicitly use characteristics of the sensor and detection algorithms. A methodology will be presented for deriving sensor/algorithm dependent clutter metric coefficients and algorithms for a broad class of systems.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John W. Hilgers, William P. Vockel, William R. Reynolds, and J. Warren Pickard "Sensor- and detection-algorithm-based clutter metrics", Proc. SPIE 3062, Targets and Backgrounds: Characterization and Representation III, (20 June 1997); https://doi.org/10.1117/12.276685
PROCEEDINGS
11 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

An adaptive tracker for ShipIR/NTCS
Proceedings of SPIE (May 12 2015)
Probability of detection using ShipIR/NV-IPM
Proceedings of SPIE (May 12 2015)
Issues in SAR model-based target recognition
Proceedings of SPIE (July 05 1995)
Tree Clutter Identification In Multispectral Imagery
Proceedings of SPIE (January 05 1989)
IRSTORM: Infrared seeker trade-off requirements model
Proceedings of SPIE (October 01 1993)

Back to Top