Nonlinear characterization of semiconductor-doped fiber

Eric Donkor; Raymond K. Boncek

doi:10.1117/12.277633

1 July 1997 Nonlinear characterization of semiconductor-doped fiber

Eric Donkor, Raymond K. Boncek

Proceedings Volume 3075, Photonic Processing Technology and Applications; (1997) https://doi.org/10.1117/12.277633
Event: AeroSense '97, 1997, Orlando, FL, United States

Abstract

We report here an experimental result for the non-linear refractive index of a CdSSe-doped fiber measured at 1313 nm. The semiconductor is in the form of nano-spherical particles randomly scattered in the glass host. The linear properties of the fiber have been reported. The approach for the measurement of the nonlinear refractive index follows the Z-scan method developed by Sheik-Bahae et al. The set-up measures the transmittance of the sample as a function of the position of the sample as it traverses through the foal point of the illuminating 1313 nm laser radiation.

Citation Download Citation

Eric Donkor and Raymond K. Boncek "Nonlinear characterization of semiconductor-doped fiber", Proc. SPIE 3075, Photonic Processing Technology and Applications, (1 July 1997); https://doi.org/10.1117/12.277633

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