Silicon Photodiode Self-Calibration As A Basis For Radiometry In The Infrared

Edward Zalewski; Miguel Tufino

doi:10.1117/12.932760

4 March 1982 Silicon Photodiode Self-Calibration As A Basis For Radiometry In The Infrared

Edward Zalewski, Miguel Tufino

Proceedings Volume 0308, Contemporary Infrared Standards and Calibration; (1982) https://doi.org/10.1117/12.932760
Event: 25th Annual Technical Symposium, 1981, San Diego, United States

Abstract

The recently developed, simple and highly accurate technique for self-calibration of the absolute response of a silicon photodiode is described. The silicon photodiode self-calibration (SPSC) technique is independent of both electrical substitition radiometers (ESR's) and blackbodies - the traditional standards of absolute radiometry. Using the SPSC technique one can obtain high accuracy over a limited wavelength range with a very small investment of time and money. This means that the SPSC technique can be conveniently used to calibrate an ESR, thus avoiding the long and tedious characterization measurements required to evaluate the radiant to electrical power calibration factor of an ESR. The wavelength dependence of the ESR calibration factor arises from variations in the reflectance of the coating used as a radiation absorber. By measuring the spectral variations of reflectance one can use the SPSC calibrated ESR to measure the absolute response of other detectors over a broad spectral range.

Citation Download Citation

Edward Zalewski and Miguel Tufino "Silicon Photodiode Self-Calibration As A Basis For Radiometry In The Infrared", Proc. SPIE 0308, Contemporary Infrared Standards and Calibration, (4 March 1982); https://doi.org/10.1117/12.932760

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