Paper
17 September 1997 Two-step temporal phase unwrapping in profilometry
Yves Surrel
Author Affiliations +
Proceedings Volume 3098, Optical Inspection and Micromeasurements II; (1997) https://doi.org/10.1117/12.281170
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany
Abstract
This paper proposes a fast phase unwrapping procedure capable of dealing with arbitrarily large phase discontinuities. Such discontinuities may be present in the phase maps obtained with the technique of profilometry by fringe projection, when the studied object presents sharp height discontinuities. In our procedure, two images are taken with high frequency projected fringes, so that spatial phase-stepping is possible. The algorithm sued eliminates the harmonics up to order 7. The fringe pitch is slightly varied between the two acquisitions, and the difference between the two obtained phase maps yields a slowing varying phase map which enables unwrapping, as it gives low frequency extra information.As compared to other proposed procedures, the present one allows to keep the high sensitivity associated with high frequency fringes, together with the large dynamic range resulting from the possibility to unwrap the phase successfully. Also, the number of frames required is less than what is needed by other techniques.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yves Surrel "Two-step temporal phase unwrapping in profilometry", Proc. SPIE 3098, Optical Inspection and Micromeasurements II, (17 September 1997); https://doi.org/10.1117/12.281170
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Cited by 4 scholarly publications.
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KEYWORDS
Optical spheres

Phase measurement

Phase shift keying

Detection and tracking algorithms

Fourier transforms

Fringe analysis

Computing systems

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