Focus and alignment of the AXAF optics

Terrance J. Gaetz; William A. Podgorski; Lester M. Cohen; Mark D. Freeman; Richard J. Edgar; Diab Jerius; Leon P. Van Speybroeck; Ping Zhao; Jeffery J. Kolodziejczak; Martin C. Weisskopf

doi:10.1117/12.278839

11 July 1997 Focus and alignment of the AXAF optics

Terrance J. Gaetz, William A. Podgorski, Lester M. Cohen, Mark D. Freeman, Richard J. Edgar, Diab Jerius, Leon P. Van Speybroeck, Ping Zhao, Jeffery J. Kolodziejczak, Martin C. Weisskopf

Author Affiliations +

Proceedings Volume 3113, Grazing Incidence and Multilayer X-Ray Optical Systems; (1997) https://doi.org/10.1117/12.278839
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

We discuss the x-ray measurement of the focus and alignment of the AXAF (Advanced X-ray Astrophysics Facility) x-ray optics. The high resolution mirror assembly (HRMA) consists of four nested Wolter type I x-ray optics. The attainment of the program goals for high resolution imaging requires that the mirror foci be coincident, both axially and laterally; in addition, the relative tilts between optics within each mirror pair must be small. The mirror tilts and the parfocalization were measured at the X-Ray Calibration Facility (XRCF) at the Marshall Space Flight Center in Huntsville, Alabama during a series of tests in the winter/spring of 1996/1997. The x-ray measurements are compared to the optical alignment data obtained by Eastman Kodak using the HRMA Alignment and Test System (HATS) during HRMA assembly. From these data a preliminary model for the relative location and rigid-body orientation of the individual mirror elements is developed; this mirror model is a component of the SAO high fidelity HRMA raytrace model.

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Terrance J. Gaetz, William A. Podgorski, Lester M. Cohen, Mark D. Freeman, Richard J. Edgar, Diab Jerius, Leon P. Van Speybroeck, Ping Zhao, Jeffery J. Kolodziejczak, and Martin C. Weisskopf "Focus and alignment of the AXAF optics", Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); https://doi.org/10.1117/12.278839

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