Paper
11 July 1997 Spectrometers for the solar patrol of extreme ultraviolet and soft x-ray radiation
Sergey V. Avakyan, Alexander I. Yefremov
Author Affiliations +
Abstract
The variations of the intensity and spectral distribution of the EUV and x-ray solar fluxes from the whole disk in the wavelength range 0.1 - 134 nm are the main reason of changes in all upper atmospheric and ionospheric parameters and one of the principal factors in the solar-terrestrial relation changes. However the permanent monitoring of the solar EUV and soft x-ray radiation (0.8 - 120 nm) is absent at present. In this paper the recent advances in the elaboration of the topical-electronic apparatus complex for the permanent space patrol of EUV and soft x-ray solar radiation are discussed and optical schemes of solar spectrometers of grazing and normal incidence with diffraction gratings and also their energetic characteristics are presented.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey V. Avakyan and Alexander I. Yefremov "Spectrometers for the solar patrol of extreme ultraviolet and soft x-ray radiation", Proc. SPIE 3113, Grazing Incidence and Multilayer X-Ray Optical Systems, (11 July 1997); https://doi.org/10.1117/12.278871
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Cited by 2 scholarly publications.
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KEYWORDS
X-rays

Spectrometers

Extreme ultraviolet

Solar processes

Aerospace engineering

Data modeling

Solar radiation models

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